Thursday, April 14, 2011 - 11:00am - 12:00pm EDT
- Location:Dibner Building, LC400
Five MetroTech Center, Brooklyn, New York
Speaker: Dr. Peilin Song
Faculty Host: Professor Sinanoglu
I will present a new technique for detecting chip alterations using intrinsic light emission in combination with electrical test. The key idea of this method is based on the fact that any active device emits infrared light emission when it is powered on. High sensitivity photon detectors can be employed to capture the weak emission while the chip under test is powered on and electric stimuli are applied to it. In particular, two main families of electrical test modes, static and dynamic, can be applied. Positive results of the application of this methodology as well as key challenges will be discussed, including spatial resolution, imaging processing, data interpretation, etc.
About the Speaker
Peilin Song is a Research Staff Member at the IBM Thomas J. Watson Research Center, where he is a manager of the Circuit Diagnostics and Testing Technology department. He joined IBM in 1997 and has since worked in the area of design for testability, fault diagnostics, fault modeling, circuit simulation, and optical testing. He has more than fifty publications, holds twenty one U.S. patents with several patents pending. In 2004, he has won the IEEE Electron Device Society Paul Rapparport Award. Also, in 2006, he received an Outstanding Contribution Award from the IEEE Computer Society. He is an IEEE Senior Member. He received his PhD in electrical engineering from the University of Rhode Island.